Our solutions leverage SubSLAM® X2 technology, which allows you to take contactless measurements with millimetre precision. Measurement accuracies of 0.1-0.15% have been verified and accredited by Bureau Veritas, for both defect measurements and distance metrology.
- Conduct distance metrology without COMPATTs, time intensive LBL array setups or INS techniques to reduce data collection times and costs
- Obtain detailed 3D defect measurements beyond the capability of traditional point-to-point measurement tooling, for higher fidelity analysis and insights.
SubSLAM feature matching technology allows you to produce 3D reconstructions of mobile objects, for contactless measurements of hulls, moorings and catenaries.
High precision 3D reconstructions can be used to reliable take repeated measurements between data collections
- Compare “as built” vs “as found” to confirm installation quality or tooling requirements.
- Conduct year-on-year difference modelling to understand structural degradation or marine growth accumulation.